The GADEST conference series provides an international forum on Gettering and Defect Engineering in Semiconductor Technology for experts in the field of semiconductor technology, semiconductor device physics and defect physics. With a clear focus on applied academic research, a major goal of the GADEST conferences is the exchange of experiences and views with industry, whose participation is strongly encouraged. Since 1985, when the conference series was established by Hans Richter of the Institute for Physics of Semiconductors of the Academy of Science of the former German Democratic Republic, it also aims at bringing together participants from eastern and western countries. The GADEST conferences are organized biennially in a spirit that encourages close interactions and discussions among the participants.
GADEST 2015 — Bad Staffelstein, Germany
September 20th to 25th, 2015, Bad Staffelstein, Germany
In 2015, GADEST will celebrate its 30th anniversary. The 16th GADEST conference will be organized by the Fraunhofer Institute for Integrated Systems and Device Technology from September 20th to 25th in Bad Staffelstein, Germany. For further information, please visit the website of the conference.Go to the website of the GADEST 2015
GADEST 2013 — Oxford, UK
In 2013, the 15th GADEST conference was held at St. John's College, Oxford, UK from 22nd to 27th September. For further information, including the conference photographs, please visit the website of the conference.Go to the website of the GADEST 2013